自動車ソフトウェア三規格参考文献
https://qiita.com/kaizen_nagoya/items/def6176e74e8cd13ca79

の参考文献を記載する。

<この項は書きかけです。順次追記します。>

388

3rd Generation Partnership Project; Technical Specification Group Services and System Aspects; Enhancement of 3GPP support for V2X scenarios; Stage 1(Release 16) 3GPP TS 22.186 V16.2.0 (2019-06).
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ISO TS 17419:2014: "Intelligent Transport Systems - Cooperative systems - Classification and management of ITS applications in a global context".
IEEE Std 1609.0-2013: "IEEE Guide for Wireless Access in V ehicular Environments (W A VE) architecture".

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The Association for the Advancement of Automotive Medicine. Abbreviated Injury Scale (AIS) 2005 – Update 2008. Barrington, IL: The Association for the Advancement of Automotive Medicine; 2008.
The Association for the Advancement of Automotive Medicine. Abbreviated Injury Scale (AIS) 2015. Chicago, IL: The Association for the Advancement of Automotive Medicine; 2016.
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Palanca S, Taylor DM, Bailey M, Cameron PA. Mechanisms of motor vehicle accidents that predict major injury. Emerg Med 2003;15:423e428.
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Abdulkhaleq A. et al., A Systematic Approach Based on STPA for Developing a Dependable Architecture for Fully Automated Driving Vehicles, 4th European STAMP Workshop 2016, Procedia Engineering, 179, 41-51, 2017
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[AW14] Abdulkhaleq, Asim; Wagner, Stefan: A software safety verification method based on system-theoretic process analysis. In: International Conference on Computer Safety, Reliability, and Security. Springer, pp. 401?412, 2014.
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[Go14] Gov.UK: , Guide to Maintaining Roadworthiness: Driver and Vehicle Standards Agency and Department for Transport, 2014.
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163

AEC Q100, Failure Mechanism Based Stress Test Qualification For Integrated Circuits http://www.aecouncil.com/Documents/AEC_Q100_Rev_J_Base_Document.pdf

1.2 Reference Documents

Current revision of the referenced documents will be in effect at the date of agreement to the qualification plan. Subs quent qualification plans will automatically use updated revisions of these
referenced documents.

1.2.1 Automotive

AEC-Q001 Guidelines for Part Average Testing
AEC-Q002 Guidelines for Statistical Yield Analysis
AEC-Q003 Guidelines for Characterizing the Electrical Performance
AEC-Q004 Zero Defects Framework
AEC-Q005 Pb-Free Requirements
AEC-Q006 Qualification Requirements for Components Using Copper (Cu) Wire Interconnections
SAE J1752/3 Integrated Circuits Radiated Emissions Measurement Procedure
SAE J1879/J1211/ZVEI Handbook for Robustness Validation of Semiconductor Devices in Automotive Applications
IATF 16949 Automotive Quality Management System Standard
AIAG Production Part Approval Process (PPAP)
AEC-Q100-001 Wire Bond Shear Test
AEC-Q100-002 Human Body Model (HBM) Electrostatic Discharge Test
AEC - Q100 - REV-J
AEC-Q100-004 IC Latch-Up Test
AEC-Q100-005 Non-Volatile Memory Program/Erase Endurance Data Retention and Operational Life Test
AEC-Q100-007 Fault Simulation and Test Grading
AEC-Q100-008 Early Life Failure Rate (ELFR)
AEC-Q100-009 Electrical Distribution Assessment
AEC-Q100-010 Solder Ball Shear Test
AEC-Q100-011 Charged Device Model (CDM) Electrostatic Discharge Test
AEC-Q100-012 Short Circuit Reliability Characterization of Smart Power Devices for 12V Systems

1.2.2 Military

MIL-STD-883 Department Of Defense Test Method Standard: Microcircuits

1.2.3 Industrial

JEDEC JESD22 Reliability Test Methods for Packaged Devices
UL-STD-94 Tests for Flammability of Plastic materials for parts in Devices and Appliances
IPC/JEDEC J-STD-002 Solderability Tests for Component Leads, Terminations, Lugs, Terminals and Wires
IPC/JEDEC J-STD-020 Moisture/Reflow Sensitivity Classification for Plastic Integrated Circuit Surface Mount Devices
JESD89 Measurement and Reporting of Alpha Particle and Terrestrial Cosmic Ray-Induced Soft Errors in Semiconductor Devices
JESD89-1 System Soft Error Rate (SSER) Test Method
JESD89-2 Test Method For Alpha Source Accelerated Soft Error Rate
JESD89-3 Test Method for Beam Accelerated Soft Error Rate
JESD94 Application Specific Qualification Using Knowledge Based Test Methodology
JESD671 Component Quality Problem Analysis and Corrective Action Requirements
JEP155 Recommended ESD Target Levels for HBM Qualification
JEP157 Recommended ESD-CDM Target Levels
JEP178 Electrostatic Discharge (ESD) Sensitivity Testing ? Reporting ESD Withstand Levels on Datasheets

164

AEC Q101, Failure Mechanism Based Stress Test Qualification For Discrete Semiconductors http://www.aecouncil.com/Documents/AEC_Q101_Rev_E_Base_Document.pdf

1.2 Reference Documents

1.2.1 Military

MIL-STD-750 Test Methods for Semiconductor Devices

1.2.2 Industrial

UL-STD-94 Test for Flammability of Plastic Materials of Parts in Devices and Appliances.
JEDEC JESD-22 Reliability Test Methods for Packaged Devices
J-STD-002 Solderability Tests for Component Leads, Terminations, Lugs, Terminals and Wires.
J-STD-020 Moisture/Reflow Sensitivity Classification for Nonhermetic Solid State Surface Mount Devices
JESD22-A113 Preconditioning of Nonhermetic Surface Mount Devices Prior to Reliability Testing
JEDEC/IPC J-STD-035 Acoustic Microscopy for Nonhermetic Encapsulated Electronic Components

1.2.3 Automotive

AEC-Q001 Guidelines for Part Average Testing
AEC-Q005 Pb-Free Test Requirements
AEC-Q006 Qualification Requirements for Components Using Copper (Cu) Wire Interconnections
AEC-Q101-001 Human Body Model (HBM) Electrostatic Discharge (ESD) Test
AEC-Q101-003 Wire Bond Shear Test
AEC-Q101-004 Miscellaneous Test Methods? Unclamped Inductive Switching? Dielectric Integrity? Destructive Physical Analysis
AEC-Q101-005 Charged Device Model (CDM) Electrostatic Discharge (ESD) Test
AEC-Q101-006 Short Circuit Reliability Characterization of Smart Power Devices for 12V Systems

1.2.4 Other

IATF 16949

1.2.5 Decommissioned

AEC-Q101-002 Machine Model (MM) Electrostatic Discharge (ESD) Test? Removed from JEDEC due to obsolescence. HBM and CDM cover virtually all known ESD-related failure mechanisms.

165

AEC Q200, Stress Test Qualification For Passive Components http://www.aecouncil.com/Documents/AEC_Q200_Rev_E_Base_Document.pdf
1.3 Reference Documents
The current revision of the referenced documents (shown below) will be in effect at the date of agreement to the qualifcation plan. Subsequent qualification plans will automatically use the latestrevisions of these referenced documents.
AEC-Q005 Pb-Free Test Requirements
AEC-Q200-001 Flame Retardance Test
AEC-Q200-002 Human Body Model (HBM) Electrostatic Discharge (ESD) Test
AEC-Q200-004 Measurement Procedures for Resettable Fuses
AEC-Q200-005 Board Flex Test
AEC-Q200-006 Terminal Strength (SMD) / Shear Stress Test
AEC-Q200-007 Voltage Surge Test
EIA-469 Standard Test Method for Destructive Physical Analysis (DPA) for Ceramic Monolithic Capacitors
IATF Quality Management System for Organizations in the Automotive Industry
IEC 60695-11-5 Fire Hazard Testing ? Part 11-5: Test Flames ? Needle Flame Test Method, Apparatus, Confirmatory Test Arrangement and Guidance
IEC 60127 Series Miniature Fuses
IEC 60068-2-21 Robustness of terminations and integral mounting devices
ISO-7637-1 Road Vehicles ? Electrical Disturbances from Conduction and Coupling ? Part 1: Definitions and General Considerations
J-STD-002 Solderability Tests for Component Leads, Terminations, Lugs, Terminals and Wires
J-STD-020 Moisture/Reflow Sensitivity Classification for Nonhermetic Surface Mount Devices
JESD22-A104 Temperature Cycling
JESD22-B100 Physical Dimension
JESD22-B106 Resistance to Solder Shock for Through-Hole Mounted Devices
JIS-C-5101-1 Fixed Capacitors for use in Electronic Equipment ? Part 1: Generic Specification
MIL-STD-202 Test Method Standard Electronic and Electrical Component Parts
MIL-STD-883 Test Method Standard Microcircuits
UL 94 Tests for Flammability of Plastic Materials for Parts in Devices and Appliance

254

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D. Tang and R. K. Iyer, "Impact of correlated failures on dependability in a VAXcluster system", Proc. 2nd Int. Working Conf. Dependable Computing for Critical Applications, pp. 175-194, 1991-Feb.
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J. Arlat, M. Aguera, L. Amat, Y. Crouzet, J.-C. Fabre, J.-C. Laprie, et al., "Fault injection for dependability validation?A methodology and some applications", IEEE Trans. Software Eng., vol. 16, no. 2, pp. 166-182, Feb. 1990.
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J. Arlat, Dependability validation by fault injection: Method implementation application, Dec. 1990.
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R. Geist, M. Smotherman and R. Talley, "Modeling recovery time distributions in ultrareliable fault-tolerant systems", Proc. 20th Int. Symp. Fault-Tolerant Computing (FTCS-20), pp. 499-504, 1990-June.
27.
W. Nelson, Applied Life Data Analysis, New York:Wiley, 1982.
28.
J. F. Lawless, Statistical Models and Methods for Lifetime Data, New York:Wiley, 1982.
29.
V. F. Nicola, M. K. Nakayama, P. Heidelberger and A. Goyal, "Fast simulation of dependability models with general failure repair and maintenance processes", Proc. 20th Int. Symp. Fault-Tolerant Computing (FTCS-20), pp. 491-498, 1990-June.
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D. A. Rennels, "Some past experiments and future plans in experimental evaluations of fault tolerance", Proc. Int. Symp. Mini and Micro-Computers in Control and Measurement, pp. 91-98, 1981.
31.
E. Martins, Validation of distributed systems by fault injection, June 1992.
32.
J. McGough, "Effects of near-coincident faults in multiprocessor systems", Proc. 5th Digital Avionics Systems Conf., pp. 16.6.1-16.6.7, 1983-Nov.
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J. Arlat and J. -C. Laprie, "On the dependability evaluation of high safety systems", Proc. 15th Int. Symp. Fault-Tolerant Computing (FTCS-15), pp. 318-323, 1985.
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370

ASAM OpenCRG http://www.asam.net/standards/detail/opencrg/

3.4. References to other standards

ISO 8855 for right handed coordinate systems
ISO 8601 for time / date
ISO 8859-1 for plain-text encoding
Georeferencing (ISO DIN 19111)
ASAM OpenDRIVE
ASAM OpenSCENARIO
IEEE 754

369

ASAM OpenDRIVE http://www.asam.net/standards/detail/opendrive/

3.3. References to other standards

XML 1.0 Schema [4]
UML 2.5.1 Standard [10]
ISO 3166-2 for country codes [8]
ISO 8855 for right handed coordinate systems
ISO 8601 for time / date [7]
Georeferencing (ISO DIN 19111)
ASAM OpenCRG [3]

371

ASAM OpenSCENARIO http://www.asam.net/standards/detail/openscenario/

Normative Reference

ASAM OpenDRIVE [1]
ASAM OpenCRG [2]
ISO 8855 [11]
ISO 8601 [4]
W3C XML Schema Definition Language [3]

Bibliography

[1] ISO 22901-1: Road vehicles - Open diagnostic data exchange (ODX). International Organisation for Standardisation, 2008.
[2] Sparx Systems, Enterprise Architects. 2019.

205

Askari S., Nourani M. Design methodology for mitigating transient errors in analogue and mixed-signal circuits. Circuits, Devices & Systems [online]. IET. November 2012, 6(6), 447-456 https://digital-library.theiet.org/content/journals/10.1049/iet-cds.2012.0053

References

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M. Singh , I. Koren . Fault-sensitivity analysis and reliability enhancement of analog-to-digital converters. IEEE Trans. VLSI Syst. , 5 , 839 - 852
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A. Maheshwari , W. Burleson , R. Tessier . Trading off transient fault tolerance and power consumption in deep submicron (DSM) VLSI circuits. IEEE Trans. VLSI Syst. , 3 , 299 - 311
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G. Wirth , F. KAstensmidt , I. Ribeiro . Single event transients in logic circuits-load and propagation induced pulse broadening. IEEE Trans. Nucl. Sci. , 6 , 2928 - 2935
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A. Antola , R. Negrini , M. Sami , N. Scarabottolo . Tolerance of transient faults in microprogrammed control units. IEEE Trans. Reliab. , 535 - 546
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Askari, S., Dwivedi, B., Saeed, A., Nourani, M.: Scalable mean voter for fault-tolerant mixed-signal circuits', IEEE Aerospace Conf., March 2010. 7) S. Roy , V. Beiu . Majority multiplexing-economical redundant fault-tolerant designs for nanoarchitectures. IEEE Trans. Nanotechnol. , 4 , 441 - 451 8) H. Cha , E. Rudnick , J. Patel , R. Iyer , G. Choi . A gate level simulation environment for alpha-particle-induced transient faults. IEEE Trans. Comput. , 1248 - 1256 9) F.L. Yang , R.A. Saleh . Simulation and analysis of transient faults in digital circuits. IEEE J. Solid State Circuits , 258 - 264 10) R. Baker . (2008) CMOS mixed signal circuit design. 11) S. Rezgui , J.J. Wang , E.C. Tung , B. Cronquist , J. McCollum , C. Actel . New methodologies for SET characterization and mitigation in flash-based FPGAs. IEEE Trans. Nucl. Sci. , 6 , 2512 - 2524 12) Cadence Design System Inc, Virtuoso Multi-Mode Simulation, Available at http://www.cadence.com/rl/Resources/datasheets/virtuoso_mmsim.pdf. 13) pan, X., Graeb, H.: Reliability analysis of analog circuits by lifetime yield prediction using worst-case distance degradation rate', Int. Symp. Quality Electronic Design, October 2010.
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S. Askari , M. Nourani , A. Namazi . Fault-tolerant A/D converter using analogue voting. IET Circuits Devices Syst. , 462 - 470
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G. Messanger . Collection of charge on junction nodes from ion tracks. IEEE Trans. Nucl. Sci. , 6 , 2024 - 2031
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J. von Neumann , C.E. Shannon , J. McCarthy . (1956) Probabilistic logics and the synthesis of reliable organisms from unreliable components, Automata Studies.
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de M. Borges, G., Gonsalves, L.F., Balen, T.R., Lubaszewski, M.S.: Increasing reliability of programmable mixed-signal systems by applying design diversity redundancy', IEEE European Test Symp. '10, May 2010, p. 261?261. 18) Mitra, S., Saxena, N.R., McCluskey, E.J.: A design diversity metric and reliability analysis for redundant systems', IEEE Int. Test Conf., 1999, p. 662?671.
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Askari, S., Dwivedi, B., Saeed, A., Nourani, M.: Scalable mean voting mechanism for fault tolerant analog circuits', IEEE Int. Design Test Workshop, November 2009. 20) Semiconductor Industry Association: The International Technology Roadmap for Semiconductors: 2010 Update, Available at http://www.itrs.net/Links/2010ITRS/2010Update/ToPost/2010-Update-Overview.pdf. 21) D.A. Johns , K. Martin . (1997) Analog integrated circuit design. 22) Namazi, A., Askari, S., Nourani, M.: Highly reliable A/D converter using analog voting', Int. Conf. Computer Design, October 2008.
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318

Automotive ISAC, Automotive Cybersecurity Best Practice. https://www.automotiveisac.com/best-practices/

References

ISO 17799: Mobile Phone Security https://www.iso.org/standard/39612.html ISO/IEC 17799:2005
Information technology ? Security techniques ? Code of practice for information security management[Withdrown]
ISO/IEC 27001?Information Security Management
ISO/IEC 27010:2012?Inter-sector and Inter-organizational Communications
ISO/IEC 27035:2011 Information Security Incident Management
ISO/IEC 30111: Vulnerability Handling Procedures
NHTSA: Cybersecurity Best Practices for Modern Vehicles
NIST 800-30: Guide for Conducting Risk Assessments
NIST SP 800-50: Building an Information Technology Security Awareness and Training Program
NIST SP 800-61: Computer Security Incident Handling Guide
NIST 800-64: Security Considerations in the Systems Development Lifecycle
NIST SP 800-121 Guide to Bluetooth Security
NIST SP-127: Guide to Securing WiMAX Wireless Communications
NIST 800-137: Continuous Monitoring for Federal Information Systems and Organizations
NIST SP 800-150: Guide to Cyber Threat Information Sharing
SAE J3061: Cybersecurity Guidebook for Cyber-Physical Vehicle Systems

Resources

Industry Associations, such as Auto Alliance and Global Automakers
International Organization for Standardization (ISO)
National Institute of Standards and Technology (NIST)
SAE International

41

Automotive SPICE [viewed 2017-10-11

53

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REFERENCES

BARER SP: Evaluation of medical care of the injured. J Trauma 11 :892-894, 1971
BAKER SP: Injury control. in Saarwan. PE (Editor): Preventive Medicine and Public Health. Appleton-Century-Crofte, 1973, p. 987-1006
BOYD DR, Lows RJ, Bann RI, a al: Trauma registry. New computer method for multifac-tonal evaluation of major health problem. JAMA 223:422-428, 1973
COMITIEE ON MEDIC.AL ASPECTS OF AUTOMOTIVE SAFETY: Rating the severity of tissue damage. I. The Abbreviated Scale. JAMA 215:277-280, 1971
COMMITTEE on MEDICAL ASI)SCES of Arromorws SAFETY: Rating the severity nf tissue damage. II. The Comprehensive Scale:Y.4MA 220:717-720, 1972
GERTNER HR JR, BAKES SP, HUT ERFORD RB, et al: Evaluation of the manage ent of ve-hicular fatalities secondary to abd hal in-jury. J Trauma 12:426-431, 1972
GIBSON 0: Research and evaluation emer-gency medical services. Health Se s Re-ports, in swats
HADDON W A note concerning accident the-ory and research with special reference to motor vehicle accidents. Ann NY Aced Sci 10 635.446, 1963
Hugon W JR: The prevention of accidents. In CLARK DW, MACMAITON B (Editors): Preven-tive Medicine. Little, Brown and Co., 1967, p. 591-621
HADDON W Jr Energy damage and the ten countermeasure strategies. Trauma 13:321- 331, 1973
SACCO WI, COWLEY RA, Gotasses MA, et al: A prognostic index in critical care medicine. Aberdeen Proving Ground, Md., Edgewood Amenal Technical Report EATR 4777, 1973
Suns JD, PENNER HA Is, Flaws EE, et al: Field application and research development of the Abbreviated Injury Scale. SAE Print 710873. New York, Society of Automotive En-gineers, 1971
Warns IA: How do we evaluate services and set priorities? Proceedings of Workshop on Emergency Health Services in Vermont. Bur-lington, University of Vermont, 1970

＜この記事は個人の過去の経験に基づく個人の感想です。現在所属する組織、業務とは関係がありません。＞

参考資料

自動車ソフトウェア三規格参考文献
https://qiita.com/kaizen_nagoya/items/def6176e74e8cd13ca79

自動車ソフトウェア三規格参考文献の参考文献
https://qiita.com/kaizen_nagoya/items/4595182168a2f7b0aa32

サイバー攻撃に防衛隊を組織教育
https://qiita.com/kaizen_nagoya/items/5bc6235c509e4fb108f0

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